http://www.sti.nasa.gov/scan/scan.html Today's Listing of New NASA STI in the NASA Aeronautics and Space Database.

]]> en-us Mon, 23 Nov 2009 10:00:00 EST http://www.sti.nasa.gov/3Dmeatball.jpg http://www.sti.nasa.gov http://www.sti.nasa.gov/scan/rss99-01.html#1123001 90% of NASA applications are < 100 krads-Si in piecepart requirements. a) Many commercial devices (NVM and SDRAMs) meet or come close to this. b) Charge pump TID tolerance has improved an order magnitude over the last 10 years. 2) There are always a few programs with higher level needs and, of course, defense needs SEL: 1) Prefer none or rates that are considered low risk. a) Latent damage is a bear to deal with. 2) As we re packing cells tighter and even with lower Vdd, we re seeing SEL on commercial devices regularly (<90nm). a) Often in power conversion, I/O, or control areas. SEU: 1) It s not the bit errors, it s the SEFIs errors that are the biggest issues. a) Scrubbing concerns for risk, power, speed....]]> Mon, 23 Nov 2009 10:00:00 EST http://www.sti.nasa.gov/scan/rss99-01.html#1123002 Mon, 23 Nov 2009 10:00:00 EST http://www.sti.nasa.gov/scan/rss99-01.html#1123003 Mon, 23 Nov 2009 10:00:00 EST